Optical Metrology
by: Kjell J. Gsvik
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Topics include: interference between two plane waves, transversal magnification, plane polariscope, wave scattered from the object, reconstructed object wave, speckle photography, wrapped phase, coherent transfer function, resulting transmittance, circular polariscope, quarterwave plate, speckle displacement, zone plate pattern, line jitter, phase unwrapping, fringe localization, filter plane, field amplitude distribution, projected fringes, reconstructed wave, temporal degree, principal stress difference, fringe period, speckle size, cavity dumping
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Book Description
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography. Features include: A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography. Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera. Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping. Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT. End-of-chapter problems and solutions. This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.
Book Info
Provides practical guidance for readers with a minimal background in optics. Explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
From the Back Cover
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
Features include:
* A chapter on computerized optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
* Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
* Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.
* End-of-chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.
Table of Contents
Preface to the Third Edition
Basics
Gaussian Optics
Interference
Diffraction
Light Sources and Detectors
Holography
Moir Methods
Triangulation
Speckle Methods
Photoelasticity and Polarized Light
Digital Image Processing
Fringe Analysis
Computerized Optical Processes
Fibre Optics Metrology
Appendix A: Complex Numbers
Appendix B: Fourier Optics
Appendix C: Fourier Series
Appendix D: The Least-Squares Error Method
Appendix E: Semiconductor Devices
References and Further Reading
Index
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