Recent Advances in Life-Testing and Reliability
by: N. Balakrishnan
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Topics include: scale change model, degradation law parameters, fluorescent lamp experiment, initial crack size distribution, subsurvival pair, dimensional survival functions, time dependent association measures, continuous reliability growth, conditional subsurvival function, lognormal regression model, assignable cause failures, semiconductor subsystem, data domain models, censoring fraction, copula models, censored residuals, reliability growth program, empirical subsurvival functions, probability weighted moments, parametric aging, joint survival function, failure truncation, bivariate survival function, analog estimators, service life length
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Book Description -- This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.
Book Info -- Discusses recent developments in methodology as well as applications, with new results presented and illustrated with many practical data sets. DLC: Accelerated life testing - Statistical methods.
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