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Contents
Section:
- Resistive High-Voltage DC Probes
- Capacitance-Divider High-Voltage AC Probes
- Test Cable Shielding and Test-Circuit Loading Fundamentals
- Resistive Circuit-Isolation Probe (The "DC Probe")
- Compensated R-C ("Low-Capacitance"), and Cathode-Follower Circuit-Isolation Probes
- Rectifying Probes for the VTVM
- Demodulator Probes
- Index
This guide is based on the 1954 Rider Publ. book ...
PREFACE
The ever-increasing application of volt-ohm-milli-ammeters (vom), vacuum tube voltmeters (vtvm) and oscilloscopes in troubleshooting and adjusting the circuits of all forms of complex electronic equipment has greatly increased the diversity of voltages, frequencies and test-circuit characteristics with which they are called upon to operate. As a result, their operating demands often exceed the inherent capabilities of these fundamental test instruments.
Suitably designed auxiliary devices, arranged in convenient "probe" form, which add new ranges and new functions to these. conventional instruments are now widely employed for extending their fields of application into circuits of very high voltage, high frequency, or high impedance. Such probes provide practical and inexpensive extensions of the inherent capabilities of the instrument, since they may be quickly connected externally to its input circuit.
The use of a variety of special-purpose instrument probes has now become a practical necessity, especially in tv receiver servicing. Consequently, it is important for every service technician to understand thoroughly the function and basic theory of operation underlying all types of probes and also the correct methods of using them to obtain the maximum amount of service they are capable of giving. It is also important to be able to quickly decide which type of probe is best suited for a particular application, so as to avoid incorrect usage which may result in misleading test instrument indications, and consequent in correct conclusions regarding the observed results of the tests.
It is the purpose of this guide to present the required information in a simple and thorough manner that will make this subject easily understandable and helpful to both practicing technicians and beginners alike, so that they will know how to use test instrument probes correctly.
The authors wish to thank Milton S. Snitzer, managing editor of John F. Rider, Publisher, Inc., who technically reviewed and edited the manuscript for this volume.
New York City, USA; August, 1954
A.A.G. R.G.M.
Also see:
Using Scopes in Transistor Circuits (1968)